Continuing
our look at the 2013 GaTech Interposer Conference.
CORRECTION to IFTLE 178:
A reader has
written in to indicating that the FPGA chip described in the Xilinx/SPIL paper
was fabricated by TSMC not UMC .
Corning and Schott Glass
As discussed
in IFTLE 170, Windsor Thomas of Corning gave a presentation entitled “The
manufacturing readiness of Glass interposers” and Schott glass followed with a
presentation entitled “New Ultra-thin Glass for Microelectronics”.
Since the
whole LCD infrastructure is based on thin glass we certainly did not need any
convincing that large panel, uniform, thin glass is available in roll and/or
large panel format. Corning like Asahi Glass and Schott glass has been
researching the formation of TSV (or TGV) for several years now and all appear
somewhat able to form through vias down to maybe 25um. The real question is how
do we than use this feedstock to get low cost glass interposers.
Though we
were shown some Cu fill experiments, neither Corning nor Schott indicated that they would enter the
interposer market, did not indicate who such a partner would be and in fact stated
that their discussions with the FPD industry( which they most certainly now
supply) indicate that there is absolutely no interest in FPD suppliers entering
the interposer supply market.
IFTLE
concludes that if any of the current glass suppliers want to see glass become a
interposer substrate material and more broadly a preferred packaging substrate
material, they must resolve who will actually be supplying the final packaging
products.
Asahi glass
has attempted to fill this void with Triton, their JV with nMode [see IFTLE 141,“100GB Wide IO memory; AGC Glass Interposers; Nvidia talks stacked memory” ]
Corning and Schott have not yet indicated what their proposed solutions are.
Shinko
Koizumi-san of Shinko discussed glass substrate
prototyping status. Shinko points out that glass cores can be used to mimic Si
like interposers or build-up PCB substrates.
He showed
data on a 200um glass core PCB with a 5/0/5 build up process ( 30um
polymer/18um thick Cu per layer) . When diced such structures resulted in what
they called “Se-wa-re” (loosely translated back split) which was fracture
through the glass core layer due to the stresses built up on both sides of the
core. Modeling calculations show that the glass internal stress is mainly
caused by the total copper layer thickness.
Altera
John Xie of
Altera examined the use of organic interconnect for stacked die
integration. Altera’s take on
Interconnect resolution trends are compared below. The proposal is that organic
build up (BU) substrate (dry processed) is rapidly approaching the capabilities
of this film BE of line packaging on silicon.
Xie contends
that high end substrate suppliers are quickly approaching 2/2 L/S and will
allow direct attach to substrate and elimination of the interposer as shown
below. This in turn will be a cost reduction driver. He calls this 2.1D or
Ultra high density organic interconnect.
They can currently get 92um bump pitch, 8um lines and 80um vias. Their 2 year
goal is to obtain 55um bump pitch, 2um lines and 20um vias.
Zeon
Zeon
introduced their ultra tine dry films for Interposer RDL applications.
Properties of the Zeon “cyclo olefin” polymer film are shown below.
Ushio
Ushio
addressed large area litho tools for 1 – 5µm
L/S. They claim their tool is capable of 2µm L/S in a 70 x 70 sq mm
area.
For all the
latest on 3DIC and advanced packaging stay linked to IFTLE………….